TSP UV 3000 UV/Vis Detector offer excellent performance and with capabilities of a diode array. It delivers multi-dimensional spectral data for applications ranging from trace analysis to preparative, as well as SFC to CE. A unique dual-beam, forward optical design minimizes refractive-index sensitivity by focusing the light beam away from the flow cell walls. The design facilitates low noise and drift. It also provides a wide linear dynamic range, and eliminates stray light. Reference and sample beams are monitored at the same wavelength for a highly accurate differential measurement. The net effect is accurate results at trace levels or at high concentrations.
Specifications | |
Wavelength range | 190 nm to 800 nm |
Wavelength Accuracy | ±2 nm |
Wavelength Precision | <0.01 nm |
Bandwidth | 6 nm |
Absorbance Linearity | ≤5% at 1.8 AU @ 257 nm |
Drift | UV3000 < 2 ×10-5AU @ 254 nm |
Slew Time | 0.020 sec |
Lamps | Deuterium and tungsten, pre-aligned |
Rise Time | Digital filter, 0.0 to 9.9 sec |
Recorder Outputs | 3 unattenuated at either 10 mV, 100 mV or 1 V per 2 AU |
Remote Controls | Autozero input, 25 pin RS-232 |
Dimensions | 37 ×15 ×47 cm (H ×W ×D) |
High Sensitivity Mode | Number of wavelengths monitored: 1–3 |
Data Rate | 24 points/sec |
Noise | Single wavelength: ± 1 ×10-5AU @ 254 |
Scanning Mode | Scan Speed: 96–960 nm/sec |
Data Rate | 96 points/sec |
Noise | ± 2 ×10-5AU @ 254 nm or 546 nm |
This refurbished TSP UV 3000 Detector is in great condition. It has been tested at SpectraLab Scientific.
A 90 day warranty is included. Multiple available.